We have learnt the following definitions of Reliability and Availability from the Fault Tolerance Measures post: Reliability, R(t): Probability that the system has been up continuously during the whole interval [0,t], given it was up at time 0. This measure is suitable…
Category: Fault Tolerant System Design
Fault Tolerance Measures
Fault tolerance of electronic system is a major concern for the VLSI engineers. This can be realized from the post Need of Fault Tolerant VLSI System Design. The objective of this post is to introduce the proper tools for fault…
Defects, Errors, and Faults
In Electronics industry incorrectness in products are described in several ways which may create confusion in understanding the terms defect, error and fault. Though these terms are used interchangeably in the field of VLSI testing, let’s try to draw a…
Redundancy in Fault Tolerance
In the previous post we have understood the need of Fault Tolerance in VLSI System Design. A VLSI system can broadly be considered as a union of following 3 layers: Hardware Layer (Processing cores, Memories, etc.) Software Layer (OS, Program…
Need of Fault Tolerant VLSI System Design
In recent few years VLSI design has achieved remarkable growth. High performance (peta-scale) computing is a reality now and we are expecting exa-scale computing by 2020. We talk about many core processor now a days. Intel’s Xeon Phi (Knights Landing)…