Let's Program the Transistors
We have learnt the following definitions of Reliability and Availability from the Fault Tolerance Measures post: Reliability, R(t): Probability that the system has been up continuously during the whole interval [0,t], given it was up at time 0. This measure is suitable for applications in which even a momentary disruption can prove costly. One example is computer…
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Fault tolerance of electronic system is a major concern for the VLSI engineers. This can be realized from the post Need of Fault Tolerant VLSI System Design. The objective of this post is to introduce the proper tools for fault tolerance measure. A measure is a mathematical abstraction, which expresses only some subset of the object’s…
In Electronics industry incorrectness in products are described in several ways which may create confusion in understanding the terms defect, error and fault. Though these terms are used interchangeably in the field of VLSI testing, let’s try to draw a fine boundary between the meaning of these terms. Before doing this, we should understand why…
In the previous post we have understood the need of Fault Tolerance in VLSI System Design. A VLSI system can broadly be considered as a union of following 3 layers: Designers introduce several techniques to all these system layers to deal with transient as well as permanent faults, and these techniques incorporate the concept of…
In recent few years VLSI design has achieved remarkable growth. High performance (peta-scale) computing is a reality now and we are expecting exa-scale computing by 2020. We talk about many core processor now a days. Intel’s Xeon Phi (Knights Landing) with 72 cores and IBM’s Kilocore processors with more than 1000 cores are great examples…